Nanoparticle Characterization

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nanoparticle characterization

Understanding the physical and chemical properties of particles is fundamental to developing superior materials, optimizing manufacturing processes, and boosting research in material sciences. Nanoparticle characterization is the process of measuring and analyzing the physical and chemical properties of nanoparticles, such as particle size distribution, shape, morphology, crystallinity, surface area, zeta potential, and chemical composition. This is achieved through various analytical techniques that enable an understanding of how different particles impact a material’s properties and performance. This is crucial not only in material sciences but also across industries such as pharmaceuticals, food manufacturing, and petrochemicals.

At Hyperion Analytical, we provide advanced particle characterization products and methodologies that deliver the critical insights for nanoparticle research and development. Additionally, we have a team of scientists with decades of combined experience in materials science, chemistry, and analytical instrumentation, while we also collaborate with subject matter experts (SMEs). Through this, we understand the types of tools required for characterization, and the lacunae the current tools have, which helps us deliver the best.

Overview of Nanoparticle Characterization

Materials range from nanometer-scale quantum dots to millimeter-sized granules, each requiring specialized analytical approaches to understand their behavior and optimize performance. Particle characterization encompasses a wide range of analytical techniques designed to measure and analyze the properties of particulate materials. Each of these properties plays a vital role in determining how particles behave in various applications, from pharmaceutical formulations to advanced ceramics and nanomaterials.

For instance, in the pharmaceutical sector, particle characteristics such as size distribution directly influences drug dissolution rates, bioavailability, and manufacturing processability. On the other hand, contamination particles of a few nanometers in size can render entire production batches of semiconductors completely unusable. Hence, the significance of particle characterization cannot be overstated. To get the right characterization across multiple length scales, from nanometers to millimeters, we offer state-of-the-art instrumentation and cutting-edge methodologies.

Particle Characterization Techniques and Methodologies Used

Particle size distribution is significant and different from the individual size. A narrow distribution indicates uniformity, while a broad distribution suggests heterogeneity that may impact performance consistency. Distribution characteristics for nanoparticles are described using statistical parameters such as mean or median sizes, standard deviation, and percentile values such as D10, D50, and D90. Here are some commonly used analytical techniques for nanoparticle characterization.

  • Dynamic Light Scattering (DLS) for submicron particles: Also known as photon correlation spectroscopy, this technique measures the Brownian motion of particles in a suspension to measure size distribution. DLS is a rapid operation technique, and excels in characterizing particles from approximately one nanometer to several microns in diameter. However, it exhibits high sensitivity to large particles or aggregates, which can dominate the scattering signal and smaller particle populations. Also, DLS is an inherently low-resolution technique because of its ensemble measurement. While similar in some respects to the Nanoparticle Tracking Analysis (NTA) technique, DLS has some significant limitations in analyzing polydisperse size distributions and is not able to count particles for an accurate number concentration analysis. Here’s where Envision NTA’s advanced optical design works and overcomes these challenges.
  • Scanning and transmission electron microscopy for morphological analysis: Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) provide direct visual characterization of particle size, shape, and morphology with resolution down to nanometers or even atomic scales. SEM creates images by scanning particle surfaces with a focused electron beam and detecting secondary or backscattered electrons, revealing three-dimensional surface topography. TEM transmits electrons, creating two-dimensional projection images that reveal internal structure and crystallinity. However, electron microscopy presents some limitations. For instance, sample preparation can introduce artifacts, while the high vacuum environment may alter hydrated samples. Despite the limitations, this technique is crucial for visual confirmation of size, shape, or structure is essential. This information is an important part of the characterization toolbox but care must be taken in interpreting this information for particles that are used in liquid suspension.
  • BET surface area measurement: The Brunauer-Emmett-Teller (BET) method measures specific surface area through gas adsorption. The technique measures the volume of gas, such as nitrogen, adsorbed on a particle surface as a function of relative pressure at liquid nitrogen temperature. BET analysis reveals the total accessible surface area, including internal pore surfaces for porous materials, and is hence useful for catalysts, adsorbents, and pharmaceutical excipients. The technique is suitable only for powdered materials and can provide useful information to understand particles in suspensions that may not be fully dispersed.
  • Zeta potential analysis for surface charge characterization: Zeta potential characterization measures the electrical potential of particles in suspension, providing insights into colloidal stability and surface charge. Zeta potential measurements guide formulation development for suspensions, emulsions, and nanoparticle dispersions, enabling the prediction of stability and the optimization of pH and electrolyte concentrations. This information may provide an explanation for why suspensions aggregate or coalesce. There a several ways to measure zeta potential and Electrophoretic Light Scattering has proven to be the most robust, easy and reliable method.

Our Envision NTA tools for nanoparticle characterization are highly versatile, enabling accurate nanoparticle tracking and characterization. Built for rigorous environments, they have unparalleled sensitivity with the lowest possible detection limit for a wide measurement range. They overcome most challenges posed when using these analytical techniques.

Industrial Applications

Here are some industrial applications of nanoparticle characterization that span numerous industries and research fields.

  • Pharmaceuticals: Here, it finds applications in nanoparticle drug delivery systems, protein and antibody aggregation studies, virus counting, vaccines, and so on.
  • Chemical processing: Catalysts play a crucial role in this sector, and our Envision NTA enables catalyst characterization and optimization.
  • Material science and nanotechnology: Here, it finds use in the comprehensive nanomaterial characterization of engineered particles with precisely controlled properties. For instance, carbon nanotubes, graphene sheets, quantum dots, metal nanoparticles, and ceramic powders each require specialized characterization approaches.
  • Environmental science: Environmental particle characterization addresses water treatment, fate and transport of nanoparticles in the environment, ecotoxicity studies, and nanoplastic monitoring. Here, it is useful in sampling nanoparticle or colloid concentration and particle size distribution to characterize material types, aggregation state and concentration.

Why Choose Hyperion Analytical for Nanoparticle Tracking Analysis Instruments

At Hyperion Analytical, we work closely with clients to understand their objectives and design customized analytical programs that address their unique challenges.

Our commitment to quality is reflected in our rigorous quality assurance protocols, adherence to international standards, and continuous investment in the latest analytical technologies. We maintain ISO-compliant procedures and participate in proficiency testing programs to ensure the accuracy and reliability of our results.

Partner with Hyperion Analytical for your particle characterization needs and learn how Envision NTA tools can make a difference in your analysis. Our Envision NTA comes with a comprehensive warranty and support coverage.